Characterization of Cu-In-Se and CuIn(S x Se 1-x ) 2 Thin Films Prepared by Chemical Spray Pyrolysis

Polycrystalline thin films of Cu-In-Se compounds and CuIn(S x Se 1- x ) 2 alloys have been grown on glass substrate by chemical spray pyrolysis (CSP). Films are characterized by X-ray diffraction, optical absorption and Raman measurements. The Cu-In-Se films with In/(Cu+In) >0.57 exhibit a characteristic Raman peak. The optical bandgap energy of the Cu-In-Se film is approximately 1.22 eV for In/(Cu+In)