X-Ray Diffraction Study of Barium Titanate Thin Films

Sychrotron diffraction study of barium titanate films grown by molecular beam epitaxy method were performed in grazing incidence geometry. Thin barium titanate film with 8 nm thick was psudomorphic nature. Upper part of the film with 40 nm showed that c-axis lay parallel to the substrate surface and in the middle of the film a-axis lay along the surface. The region, where c-axis lies parallel to the substrate, is quite possible to be 90° domain of BT film.