Crystallization of Amorphous Marks in SbTe Erasable Optical Storage Media
We present new measuring methods for amorphizing sensitivity, erasing time and amorphous life at room temperature of small amorphous marks formed by laser quenching. It is found that the Sb 2 Te 3 film has both the shortest erasing time and the longest life of the Sb x Te 1-x sputtered films. In add...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 1987-01, Vol.26 (S4), p.51 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | We present new measuring methods for amorphizing sensitivity, erasing time and amorphous life at room temperature of small amorphous marks formed by laser quenching. It is found that the Sb
2
Te
3
film has both the shortest erasing time and the longest life of the Sb
x
Te
1-x
sputtered films. In addition, the amorphous state of marks crystallizes at a lower temperature than that of as-sputtered films. |
|---|---|
| ISSN: | 0021-4922 1347-4065 |
| DOI: | 10.7567/JJAPS.26S4.51 |