Formation of Tetragonal InBi Clusters in InAsBi/InAs(100) Heterostructures Grown by Molecular Beam Epitaxy
This work analyses the Bi incorporation in InAs 1-x Bi x /InAs(100) epilayers grown by MBE through advanced transmission electron microscopy techniques. Samples grown from 350--400 °C resulted in Bi contents ${
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Veröffentlicht in: | Applied physics express 2013-11, Vol.6 (11), p.112601-112601-4 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | This work analyses the Bi incorporation in InAs 1-x Bi x /InAs(100) epilayers grown by MBE through advanced transmission electron microscopy techniques. Samples grown from 350--400 °C resulted in Bi contents ${ |
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ISSN: | 1882-0778 1882-0786 |
DOI: | 10.7567/APEX.6.112601 |