Polarization of Photoluminescence from Partial Dislocations in 4H-SiC

Polarization characteristics of luminescence from partial dislocations (PDs) in 4H-SiC have been investigated by room-temperature photoluminescence (PL) imaging. The PLs from mobile PDs under optical excitation, which are 30°-Si(g) PDs, and PDs tilted by 6° from their Burgers vector (6°-PDs) were fo...

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Veröffentlicht in:Applied physics express 2013-01, Vol.6 (1), p.011301-011301-3, Article 011301
Hauptverfasser: Hirano, Rii, Tsuchida, Hidekazu, Tajima, Michio, Itoh, Kohei M, Maeda, Koji
Format: Artikel
Sprache:eng
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Zusammenfassung:Polarization characteristics of luminescence from partial dislocations (PDs) in 4H-SiC have been investigated by room-temperature photoluminescence (PL) imaging. The PLs from mobile PDs under optical excitation, which are 30°-Si(g) PDs, and PDs tilted by 6° from their Burgers vector (6°-PDs) were found to be polarized perpendicular to their dislocation lines. In contrast, the PL from immobile 30°-C(g) PDs was not polarized. The present results suggest that the carriers bound to the 30°-Si(g) and 6°-PDs have anisotropic wave functions and those bound to 30°-C(g) PDs have isotropic wave functions.
ISSN:1882-0778
1882-0786
1882-0786
DOI:10.7567/APEX.6.011301