Growth of a lattice-matched GaAsPN p-i-n junction on a Si substrate for monolithic III-V/Si tandem solar cells

A p-i-n GaAs0.75P0.19N0.06 structure lattice-matched to Si was realized on a 2-in. Si (001) substrate for monolithic tandem solar cells. The sample structure had mirror-like surfaces without any indication of pinholes or microcracks. X-ray diffraction results showed that all the layers were coherent...

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Veröffentlicht in:Applied physics express 2017-07, Vol.10 (7), p.75504
Hauptverfasser: Yamane, Keisuke, Goto, Masaya, Takahashi, Kenjiro, Sato, Kento, Sekiguchi, Hiroto, Okada, Hiroshi, Wakahara, Akihiro
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Sprache:eng
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Zusammenfassung:A p-i-n GaAs0.75P0.19N0.06 structure lattice-matched to Si was realized on a 2-in. Si (001) substrate for monolithic tandem solar cells. The sample structure had mirror-like surfaces without any indication of pinholes or microcracks. X-ray diffraction results showed that all the layers were coherently grown on the Si substrate. Transmission electron microscopy results evidently showed that a dislocation-free device structure was grown on the Si substrate. Finally, current-voltage characteristics showed rectifying properties with low reverse saturation current, which was indicative of the high crystallinity of the device layer.
ISSN:1882-0778
1882-0786
DOI:10.7567/APEX.10.075504