X-RAY DIFFRACTION METHOD FOR DETERMINATION OF SIZES AND STRUCTURAL CHARACTERISTICS OF NANOGRAPHITES IN ACTIVATED CARBON MATERIALS

The method for determination of sizes and structural characteristics of nanographites in activated carbon fibers (ACFs) by analyzing their experimental X-ray diffraction profiles has been developed in the paper. It uses the curves of X‑ray scattering calculated for the set of nanographites consisting of benzene- and phenalene-bazed nanographenes of various sizes, which interatomic and interlayer distances depend on the number of atoms in layer. The developed method can be also applied to analysis of the X-ray diffraction profiles of other nanocrystalline graphite structures. The data acquired by the method agree with results of Raman spectroscopy and small-angle X-ray scattering on ACFs structure motives.