Frontiers in Crystallography with Synchrotron Radiation. Utilizing of Various Properties of Synchrotron Radiation. High Precision Lattice Spacing Measurement of GaAs Single Crystals
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Veröffentlicht in: | Nihon Kesshō Gakkaishi 1997, Vol.39 (1), p.99-104 |
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container_title | Nihon Kesshō Gakkaishi |
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creator | ANDO, Masami YASUAMI, Shigeru |
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doi_str_mv | 10.5940/jcrsj.39.99 |
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title | Frontiers in Crystallography with Synchrotron Radiation. Utilizing of Various Properties of Synchrotron Radiation. High Precision Lattice Spacing Measurement of GaAs Single Crystals |
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