A machine learning supported sinogram interpolation method for X-ray computed tomography

The time of an X-ray Computed Tomography (XCT) measurement is directly affected by the number of acquired X-ray projections. In general, a large number of X-ray projections, hence a large acquisition time is required to obtain a qualitative reconstruction and successive feature analysis. To expand t...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:E-journal of Nondestructive Testing 2023-03, Vol.28 (3)
Hauptverfasser: Bellens, Simon, Janssens, Michel, Vandewalle, Patrick, Dewulf, Wim
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The time of an X-ray Computed Tomography (XCT) measurement is directly affected by the number of acquired X-ray projections. In general, a large number of X-ray projections, hence a large acquisition time is required to obtain a qualitative reconstruction and successive feature analysis. To expand the applicability of XCT towards low-end parts we propose a novel sinogram interpolation method that incorporates the object rotation. The method combines a forward projection model of the XCT system and a deep learning regression model to generate intermediate X-ray projections for XCT scans with a reduced number of projections. Thereby, the accompanying reconstruction artefacts can be reduced while preserving a lower acquisition time. The method is validated on simulated projections of the 3D Shepp-Logan phantom and simulated projections of real 3D printed components using the ASTRA-toolbox. Within the reconstructions, less streaking artefacts are observed and an increased contrast between different features is obtained without introducing rotational artefacts.
ISSN:1435-4934
1435-4934
DOI:10.58286/27720