A machine learning supported sinogram interpolation method for X-ray computed tomography
The time of an X-ray Computed Tomography (XCT) measurement is directly affected by the number of acquired X-ray projections. In general, a large number of X-ray projections, hence a large acquisition time is required to obtain a qualitative reconstruction and successive feature analysis. To expand t...
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Veröffentlicht in: | E-journal of Nondestructive Testing 2023-03, Vol.28 (3) |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The time of an X-ray Computed Tomography (XCT) measurement is directly affected by the number of acquired X-ray projections. In general, a large number of X-ray projections, hence a large acquisition time is required to obtain a qualitative reconstruction and successive feature analysis. To expand the applicability of XCT towards low-end parts we propose a novel sinogram interpolation method that incorporates the object rotation. The method combines a forward projection model of the XCT system and a deep learning regression model to generate intermediate X-ray projections for XCT scans with a reduced number of projections. Thereby, the accompanying reconstruction artefacts can be reduced while preserving a lower acquisition time. The method is validated on simulated projections of the 3D Shepp-Logan phantom and simulated projections of real 3D printed components using the ASTRA-toolbox. Within the reconstructions, less streaking artefacts are observed and an increased contrast between different features is obtained without introducing rotational artefacts. |
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ISSN: | 1435-4934 1435-4934 |
DOI: | 10.58286/27720 |