Potassium Silicate, Against Water Stress, in Sweet Corn Plant Growth Traits

Water stress in sweet corn plants due effect of climatic events, such as El Niño, is difficult to monitor, leading to considerable losses. Silicon (Si) as an exogenous resistance elicitor may reduce water stress effects. The relationship between sweet corn plant age and its development, under induced water stress and leaf potassium silicate applications were evaluated. This work was carried out with the hybrid Tropical Plus®, in a randomized factorial block design with 15, 30, 45 and 60 kPa as soil water tensions in plots and potassium silicate doses (0, 6, 12 and 24 L ha-1) in subplots. Stem diameter, plant height and leaf number per plant were evaluated at 30, 45, 60, 75 and 90 days after seeding. Root length was measured on the 90th day after seeding. Sweet corn plants submitted to water stress conditions and Si application showed an age-dependent response. Water stress did not decrease stem diameter, plant height and number of leaves per plant sprayed with Si. Root length was longer with 60 kPa soil water tension. Silicon reduced negative impacts of water stress on sweet corn plants.