X-Ray Properties of SPT-selected Galaxy Clusters at 0.2 < z < 1.5 Observed with XMM-Newton
We present measurements of the X-ray observables of the intracluster medium (ICM), including luminosity LX, ICM mass MICM, emission-weighted mean temperature TX, and integrated pressure YX, that are derived from XMM-Newton X-ray observations of a Sunyaev-Zel'dovich effect (SZE) selected sample...
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Veröffentlicht in: | The Astrophysical journal 2019-01, Vol.871 (1), p.50 |
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Sprache: | eng |
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Zusammenfassung: | We present measurements of the X-ray observables of the intracluster medium (ICM), including luminosity LX, ICM mass MICM, emission-weighted mean temperature TX, and integrated pressure YX, that are derived from XMM-Newton X-ray observations of a Sunyaev-Zel'dovich effect (SZE) selected sample of 59 galaxy clusters from the South Pole Telescope SPT-SZ survey that span the redshift range 0.20 < z < 1.5. We constrain the best-fit power-law scaling relations between X-ray observables, redshift, and halo mass. The halo masses are estimated based on previously published SZE observable-to-mass scaling relations, calibrated using information that includes the halo mass function. Employing SZE-based masses in this sample enables us to constrain these scaling relations for massive galaxy clusters (M500 ≥ 3 × 1014 M ) to the highest redshifts where these clusters exist without concern for X-ray selection biases. We find that the mass trends are steeper than self-similarity in all cases, and with ≥2.5 significance in the case of LX and MICM. The redshift trends are consistent with the self-similar expectation, but the uncertainties remain large. Core-included scaling relations tend to have steeper mass trends for LX. There is no convincing evidence for a redshift-dependent mass trend in any observable. The constraints on the amplitudes of the fitted scaling relations are currently limited by the systematic uncertainties on the SZE-based halo masses, but the redshift and mass trends are limited by the X-ray sample size and the measurement uncertainties of the X-ray observables. |
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ISSN: | 0004-637X 1538-4357 |
DOI: | 10.3847/1538-4357/aaf230 |