Nitrogen-doped β-Ga 2 O 3 vertical transistors with a threshold voltage of ≥1.3 V and a channel mobility of 100 cm 2 V −1 s −1

We demonstrate high-performance normally-off multi-fin β -Ga 2 O 3 vertical transistors with a wide fin width from 1.0 to 2.0 μ m by using a nitrogen-doped β -Ga 2 O 3 high-resistive layer grown by halide vapor phase epitaxy. Normally-off operation was achieved with a threshold voltage of ≥1.3 V, a...

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Veröffentlicht in:Applied physics express 2023-03, Vol.16 (3), p.36503
Hauptverfasser: Wakimoto, Daiki, Lin, Chia-Hung, Thieu, Quang Tu, Miyamoto, Hironobu, Sasaki, Kohei, Kuramata, Akito
Format: Artikel
Sprache:eng
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Zusammenfassung:We demonstrate high-performance normally-off multi-fin β -Ga 2 O 3 vertical transistors with a wide fin width from 1.0 to 2.0 μ m by using a nitrogen-doped β -Ga 2 O 3 high-resistive layer grown by halide vapor phase epitaxy. Normally-off operation was achieved with a threshold voltage of ≥1.3 V, a specific on-resistance of 2.9 mΩ·cm 2 and a current density of 760 A cm −2 at a gate voltage of +10 V. The estimated MOS channel field effect mobility was ∼100 cm 2 V −1 s −1 . These findings offer important insights on the development of Ga 2 O 3 MOSFETs and show the great promise of Ga 2 O 3 vertical power devices.
ISSN:1882-0778
1882-0786
DOI:10.35848/1882-0786/acc30e