Silicon Trench Etching by Electron Cyclotron Resonance Plasma

Hitachi High-Technologies released a new dry plasma etcher designated as the Hitachi M-6180 and targeted for deep silicon trench etch. The new Hitachi M-6180 deep trench etcher provides for excellent uniformity, superior trench profiles, and high selectivity. The Hitachi M-6180 is based on an ECR (E...

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Veröffentlicht in:Journal of the Vacuum Society of Japan 2010, Vol.53(7), pp.435-440
Hauptverfasser: ENTA, Yutaka, FURUSE, Muneo, TAKATA, Kazuo, TSUTSUMI, Takashi
Format: Artikel
Sprache:eng ; jpn
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Zusammenfassung:Hitachi High-Technologies released a new dry plasma etcher designated as the Hitachi M-6180 and targeted for deep silicon trench etch. The new Hitachi M-6180 deep trench etcher provides for excellent uniformity, superior trench profiles, and high selectivity. The Hitachi M-6180 is based on an ECR (Electron Cyclotron Resonance) plasma source able to generate a high density (1×1011 cm-3) plasma at 0.01 Pa. The low temperature and low pressure reactions of the Hitachi M-6180 achieve superior trench profiles with no sidewall residue. The clean nature of the Hitachi M-6180 ECR etch chamber allows for Mean Time Between Wet Cleaning (MTBW) that is extremely long and particle levels that are very low.
ISSN:1882-2398
1882-4749
DOI:10.3131/jvsj2.53.435