Silicon Trench Etching by Electron Cyclotron Resonance Plasma
Hitachi High-Technologies released a new dry plasma etcher designated as the Hitachi M-6180 and targeted for deep silicon trench etch. The new Hitachi M-6180 deep trench etcher provides for excellent uniformity, superior trench profiles, and high selectivity. The Hitachi M-6180 is based on an ECR (E...
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Veröffentlicht in: | Journal of the Vacuum Society of Japan 2010, Vol.53(7), pp.435-440 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng ; jpn |
Online-Zugang: | Volltext |
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Zusammenfassung: | Hitachi High-Technologies released a new dry plasma etcher designated as the Hitachi M-6180 and targeted for deep silicon trench etch. The new Hitachi M-6180 deep trench etcher provides for excellent uniformity, superior trench profiles, and high selectivity. The Hitachi M-6180 is based on an ECR (Electron Cyclotron Resonance) plasma source able to generate a high density (1×1011 cm-3) plasma at 0.01 Pa. The low temperature and low pressure reactions of the Hitachi M-6180 achieve superior trench profiles with no sidewall residue. The clean nature of the Hitachi M-6180 ECR etch chamber allows for Mean Time Between Wet Cleaning (MTBW) that is extremely long and particle levels that are very low. |
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ISSN: | 1882-2398 1882-4749 |
DOI: | 10.3131/jvsj2.53.435 |