Near-field microwave tomography of subsurface dielectric layers

Near-field microwave tomography of subsurface dielectric layers

There is represented a method of 3D visualization of a structure of dielectric objects with small loss on a basis of data, obtained by scanning with near-field microwave microscope. Theoretical model was proven by means of experimental research of amount of test objects. We researched possibility of...

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Veröffentlicht in:Radioelectronics and communications systems 2012-03, Vol.55 (3), p.131-135
Hauptverfasser: Gayday, Yu. A., Sidorenko, V. S., Sinkevych, O. V.
Format: Artikel
Sprache:eng
Schlagworte:
Communications Engineering
Engineering
Networks
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Zusammenfassung:There is represented a method of 3D visualization of a structure of dielectric objects with small loss on a basis of data, obtained by scanning with near-field microwave microscope. Theoretical model was proven by means of experimental research of amount of test objects. We researched possibility of probes with complex geometry application for defectoscopy of dielectric materials analysis of volumetric non-uniformities.
ISSN:0735-2727
1934-8061
DOI:10.3103/S0735272712030041