Development of an Interferometer for Measurement of Linear Grating and Index Scales

This paper describes of development an interferometer for measurement grating and index scales. The interferometer is provided with a photo-electric microscope to detect the edge of the scale grating. Measuring object is fixed on a double-moving table. An upper table is supported by the cross roll guide ways and driven by a laminating piezo-actuator. An under table is supported by the pneumatic half-floating slideways, and driven by lead screw. In this article, the specification, system and specific constructions, heat insulating plan, calibration of laser wavelength, estimate of the errors, and performance are described. The interferometer has the following specifications : (1) Measuring range is 200mm, (2) Fringe counting resolution of primary development is 8nm, secondary one is 4nm, (3) Interferometric light is He-Ne laser, (4) Thermometer is platinum resistance thermometer.