Estimation of Power and Delay in CMOS Circuits using Leakage Control Transistor

With a rapid growth in semiconductor Industry, complex applications are being implemented using small size chips, with the use of Complementary Metal Oxide Semi-Conductors (CMOS). With the introduction of new Integrated Circuit (IC) technology, the speed of the circuits has been increased by around...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Carpathian journal of electronic and computer engineering 2018-12, Vol.11 (2), p.25-28
Hauptverfasser: Kumar, Aylapogu Pramod, Aditya, B.L.V.S.S, Sony, G., Prasanna, Ch, Satish, A.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:With a rapid growth in semiconductor Industry, complex applications are being implemented using small size chips, with the use of Complementary Metal Oxide Semi-Conductors (CMOS). With the introduction of new Integrated Circuit (IC) technology, the speed of the circuits has been increased by around 30%. But it was observed that for every two years, the power dissipation of a circuit doubles. The main reason for this power dissipation is leakage currents in the circuit. To reduce these leakage currents, we can reduce the width of the device. In addition to this, we can use lector techniques that use Leakage Control Transistors (LCT) and High Threshold Leakage Control Transistors (HTLCT).In this paper; we present a circuit technique that uses 130 nano-meter CMOS VLSI circuits that use two extra transistors to mitigate the leakage currents. The proposed technique overcomes the limitations posed by the existing methods for leakage reductions an average leakage reductions is 82.5%.The estimation of power and delay will be discussed using LCT’s and HTLCT’s.
ISSN:2343-8908
2343-8908
DOI:10.2478/cjece-2018-0014