Detection and Observation of Fatigue Damage in Metallic Thin Wires with an A.C. Potential Method and a Digital Microscopy

Detection and Observation of Fatigue Damage in Metallic Thin Wires with an A.C. Potential Method and a Digital Microscopy

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Zairyō 2005, Vol.54 (10), p.1047-1051
Hauptverfasser: NAKAI, Yoshikazu, HASHIMOTO, Akihisa, TAKETANI, Akihiko
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1051
container_issue 10
container_start_page 1047
container_title Zairyō
container_volume 54
creator NAKAI, Yoshikazu
HASHIMOTO, Akihisa
TAKETANI, Akihiko
description
doi_str_mv 10.2472/jsms.54.1047
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_2472_jsms_54_1047</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_2472_jsms_54_1047</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1187-432577c19b8d45eb35a5ec69e4c7215568a2a16920beb5f846412f2eacac4cf63</originalsourceid><addsrcrecordid>eNotkMFOwzAQRC0EEqVw4wP8ASTYjjd2j1VLAamoHIo4Rht307pKkyo2oPw9TeG0M6vdGekxdi9FqrRRj_twCCnoVAptLthIWisSo629ZCMBUicg8-ya3YSwF0JDBjBi_ZwiuejbhmOz4asyUPeNZ99WfHFS2y_iczzglrhv-BtFrGvv-Hp3cp--o8B_fNydvvk0naX8vY3URI_1cLprN-dY5HO_9XFYete1wbXH_pZdVVgHuvufY_axeFrPXpLl6vl1Nl0mTkprEp0pMMbJSWk3GqjMAIFcPiHtjJIAuUWFMp8oUVIJldW5lqpShA6ddlWejdnDX-5QHDqqimPnD9j1hRTFgK0YsBWgiwFb9gu51WE2</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Detection and Observation of Fatigue Damage in Metallic Thin Wires with an A.C. Potential Method and a Digital Microscopy</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><creator>NAKAI, Yoshikazu ; HASHIMOTO, Akihisa ; TAKETANI, Akihiko</creator><creatorcontrib>NAKAI, Yoshikazu ; HASHIMOTO, Akihisa ; TAKETANI, Akihiko</creatorcontrib><identifier>ISSN: 0514-5163</identifier><identifier>EISSN: 1880-7488</identifier><identifier>DOI: 10.2472/jsms.54.1047</identifier><language>eng</language><ispartof>Zairyō, 2005, Vol.54 (10), p.1047-1051</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1187-432577c19b8d45eb35a5ec69e4c7215568a2a16920beb5f846412f2eacac4cf63</citedby><cites>FETCH-LOGICAL-c1187-432577c19b8d45eb35a5ec69e4c7215568a2a16920beb5f846412f2eacac4cf63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,4010,27900,27901,27902</link.rule.ids></links><search><creatorcontrib>NAKAI, Yoshikazu</creatorcontrib><creatorcontrib>HASHIMOTO, Akihisa</creatorcontrib><creatorcontrib>TAKETANI, Akihiko</creatorcontrib><title>Detection and Observation of Fatigue Damage in Metallic Thin Wires with an A.C. Potential Method and a Digital Microscopy</title><title>Zairyō</title><issn>0514-5163</issn><issn>1880-7488</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNotkMFOwzAQRC0EEqVw4wP8ASTYjjd2j1VLAamoHIo4Rht307pKkyo2oPw9TeG0M6vdGekxdi9FqrRRj_twCCnoVAptLthIWisSo629ZCMBUicg8-ya3YSwF0JDBjBi_ZwiuejbhmOz4asyUPeNZ99WfHFS2y_iczzglrhv-BtFrGvv-Hp3cp--o8B_fNydvvk0naX8vY3URI_1cLprN-dY5HO_9XFYete1wbXH_pZdVVgHuvufY_axeFrPXpLl6vl1Nl0mTkprEp0pMMbJSWk3GqjMAIFcPiHtjJIAuUWFMp8oUVIJldW5lqpShA6ddlWejdnDX-5QHDqqimPnD9j1hRTFgK0YsBWgiwFb9gu51WE2</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>NAKAI, Yoshikazu</creator><creator>HASHIMOTO, Akihisa</creator><creator>TAKETANI, Akihiko</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>2005</creationdate><title>Detection and Observation of Fatigue Damage in Metallic Thin Wires with an A.C. Potential Method and a Digital Microscopy</title><author>NAKAI, Yoshikazu ; HASHIMOTO, Akihisa ; TAKETANI, Akihiko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1187-432577c19b8d45eb35a5ec69e4c7215568a2a16920beb5f846412f2eacac4cf63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><toplevel>online_resources</toplevel><creatorcontrib>NAKAI, Yoshikazu</creatorcontrib><creatorcontrib>HASHIMOTO, Akihisa</creatorcontrib><creatorcontrib>TAKETANI, Akihiko</creatorcontrib><collection>CrossRef</collection><jtitle>Zairyō</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>NAKAI, Yoshikazu</au><au>HASHIMOTO, Akihisa</au><au>TAKETANI, Akihiko</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Detection and Observation of Fatigue Damage in Metallic Thin Wires with an A.C. Potential Method and a Digital Microscopy</atitle><jtitle>Zairyō</jtitle><date>2005</date><risdate>2005</risdate><volume>54</volume><issue>10</issue><spage>1047</spage><epage>1051</epage><pages>1047-1051</pages><issn>0514-5163</issn><eissn>1880-7488</eissn><doi>10.2472/jsms.54.1047</doi><tpages>5</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0514-5163
ispartof Zairyō, 2005, Vol.54 (10), p.1047-1051
issn 0514-5163
1880-7488
language eng
recordid cdi_crossref_primary_10_2472_jsms_54_1047
source Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals
title Detection and Observation of Fatigue Damage in Metallic Thin Wires with an A.C. Potential Method and a Digital Microscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T11%3A14%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Detection%20and%20Observation%20of%20Fatigue%20Damage%20in%20Metallic%20Thin%20Wires%20with%20an%20A.C.%20Potential%20Method%20and%20a%20Digital%20Microscopy&rft.jtitle=Zairyo%CC%84&rft.au=NAKAI,%20Yoshikazu&rft.date=2005&rft.volume=54&rft.issue=10&rft.spage=1047&rft.epage=1051&rft.pages=1047-1051&rft.issn=0514-5163&rft.eissn=1880-7488&rft_id=info:doi/10.2472/jsms.54.1047&rft_dat=%3Ccrossref%3E10_2472_jsms_54_1047%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true