An Apparatus for X-ray Diffraction by Oscillation Technique

A new oscillation apparatus has been developed as an X-ray diffraction technique. The apparatus is composed of two parts. The one rotates the sample around the normal of the surface, and the other oscillates within a possible range of angle around the oscillation axis; a given sample is oscillated simultaneously around both of the axes. The use of the apparatus allowed the accurate determination of materials with coarse grained crystals or textured grains; the maximum grain size measurable by the present method (oscillation angle, ±30°) was found to be about seventeen times (∼850 μm in size) larger than for the case without the oscillation.