P‐35: The Effects of NiSi 2 Seed Control on SGS Crystallization and TFT Characteristics

To improve TFT characteristics and reduce leakage current, we have investigated the precise control of NiSi 2 seed shapes in a process called super grain silicon (SGS) crystallization. Excessive leakage current was reduced by the control of Ni in Si below ∼10 13 atoms/cm 2 . Relatively higher SGS cr...

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Veröffentlicht in:SID International Symposium Digest of technical papers 2011-06, Vol.42 (1), p.1219-1222
Hauptverfasser: Chung, Yun Mo, Lee, Ki‐Yong, Seo, Jinwook, Chung, Minjae, Park, Byoung Keon, Lee, Donghyun, Kim, Hye Dong, Kim, Sang Soo
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Sprache:eng
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Zusammenfassung:To improve TFT characteristics and reduce leakage current, we have investigated the precise control of NiSi 2 seed shapes in a process called super grain silicon (SGS) crystallization. Excessive leakage current was reduced by the control of Ni in Si below ∼10 13 atoms/cm 2 . Relatively higher SGS crystallinity of about 94% was obtained by inducing (111) NiSi 2 seed to form a disc shape rather than that from a pyramid shaped seed with about 92%, resulting in more uniform TFT characteristics. Based on this seed control method, we fabricated a 14″ AMOLED TV having a pixel‐to‐pixel brightness uniformity of about 92%, which we believe is suitable for product acceptance.
ISSN:0097-966X
2168-0159
DOI:10.1889/1.3621050