P-146: Image-Sticking characteristic at the Fringe-Field Switching (FFS) mode with Gate-Shielding Structure

We have investigated image‐sticking characteristic at the FFS mode with gate‐shielding structure that can eliminate the noise field which is the source of residual DC voltage between pixel electrode and gate bus line. The FFS mode with new Pixel Common Inversion (PCI) structure which has gate‐shielding structure shows good image sticking property compared to the conventional structure and this new structure has many advantages for image quality at wide size LCD‐TVs and high end monitor display.