46.3: A 2.2″ QVGA a-Si TFT LCD with High Reliability Integrated Gate Driver
A 2.2″ QVGA a‐Si TFT‐LCD with a novel integrated gate driver has been developed. High reliability is achieved by assigning pull‐down and retention processes to two individual TFTs and by stabilizing the gate voltages of the pull‐up TFTs. The developed LCD shows sufficient performance even at −35°C a...
Gespeichert in:
| Veröffentlicht in: | SID International Symposium Digest of technical papers 2006-06, Vol.37 (1), p.1551-1554 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | A 2.2″ QVGA a‐Si TFT‐LCD with a novel integrated gate driver has been developed. High reliability is achieved by assigning pull‐down and retention processes to two individual TFTs and by stabilizing the gate voltages of the pull‐up TFTs. The developed LCD shows sufficient performance even at −35°C after a 5000hour operation test at 55°C. |
|---|---|
| ISSN: | 0097-966X 2168-0159 |
| DOI: | 10.1889/1.2433291 |