NIR technology for non-destructive monitoring of apple quality during storage

NIR technology for non-destructive monitoring of apple quality during storage

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Veröffentlicht in:LogForum (Poznań, Poland) Poland), 2024-01, Vol.20 (1), p.11-21
Hauptverfasser: Włodarska, Katarzyna, Pawlak-Lemańska, Katarzyna, Sikorska, Ewa
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container_issue 1
container_start_page 11
container_title LogForum (Poznań, Poland)
container_volume 20
creator Włodarska, Katarzyna
Pawlak-Lemańska, Katarzyna
Sikorska, Ewa
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doi_str_mv 10.17270/J.LOG.000968
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fullrecord <record><control><sourceid>econis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_17270_J_LOG_000968</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1887162615</sourcerecordid><originalsourceid>FETCH-LOGICAL-c289t-997670c721a67ec031892ccaceb03903f4f14449b13c6314b066ad885a4596e23</originalsourceid><addsrcrecordid>eNpFkFtLAzEQhYMoWGoffc8fSJ1cNpdHKV5aqoIo-LakabaubDdrsivsvzd0BZ9mmPmYOecgdE1hSRVTcLNZbl8elgBgpD5DM6q4IKIwH-e516YgDLi-RIuUvjIDsqAMYIaentevuPfusw1NOIy4ChG3oSV7n_o4uL7-8fgY2roPsW4POFTYdl3j8fdgm7of8X44zVPe24O_QheVbZJf_NU5er-_e1s9kixtvbrdEse06YkxSipwilErlXfAs0DmnHV-B9wAr0RFhRBmR7mTnIodSGn3Whc2G5Ke8Tki010XQ0rRV2UX66ONY0mhPMVRbsr8s5ziyDyeeO-yl_RPa62oZJIW_Bc7i1z-</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>NIR technology for non-destructive monitoring of apple quality during storage</title><source>EZB-FREE-00999 freely available EZB journals</source><source>Business Source Complete</source><creator>Włodarska, Katarzyna ; Pawlak-Lemańska, Katarzyna ; Sikorska, Ewa</creator><creatorcontrib>Włodarska, Katarzyna ; Pawlak-Lemańska, Katarzyna ; Sikorska, Ewa ; Institute of Quality Science, Poznań University of Economics and Business, Poland</creatorcontrib><identifier>ISSN: 1895-2038</identifier><identifier>EISSN: 1734-459X</identifier><identifier>DOI: 10.17270/J.LOG.000968</identifier><language>eng</language><ispartof>LogForum (Poznań, Poland), 2024-01, Vol.20 (1), p.11-21</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Włodarska, Katarzyna</creatorcontrib><creatorcontrib>Pawlak-Lemańska, Katarzyna</creatorcontrib><creatorcontrib>Sikorska, Ewa</creatorcontrib><creatorcontrib>Institute of Quality Science, Poznań University of Economics and Business, Poland</creatorcontrib><title>NIR technology for non-destructive monitoring of apple quality during storage</title><title>LogForum (Poznań, Poland)</title><issn>1895-2038</issn><issn>1734-459X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNpFkFtLAzEQhYMoWGoffc8fSJ1cNpdHKV5aqoIo-LakabaubDdrsivsvzd0BZ9mmPmYOecgdE1hSRVTcLNZbl8elgBgpD5DM6q4IKIwH-e516YgDLi-RIuUvjIDsqAMYIaentevuPfusw1NOIy4ChG3oSV7n_o4uL7-8fgY2roPsW4POFTYdl3j8fdgm7of8X44zVPe24O_QheVbZJf_NU5er-_e1s9kixtvbrdEse06YkxSipwilErlXfAs0DmnHV-B9wAr0RFhRBmR7mTnIodSGn3Whc2G5Ke8Tki010XQ0rRV2UX66ONY0mhPMVRbsr8s5ziyDyeeO-yl_RPa62oZJIW_Bc7i1z-</recordid><startdate>20240101</startdate><enddate>20240101</enddate><creator>Włodarska, Katarzyna</creator><creator>Pawlak-Lemańska, Katarzyna</creator><creator>Sikorska, Ewa</creator><scope>OQ6</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20240101</creationdate><title>NIR technology for non-destructive monitoring of apple quality during storage</title><author>Włodarska, Katarzyna ; Pawlak-Lemańska, Katarzyna ; Sikorska, Ewa</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c289t-997670c721a67ec031892ccaceb03903f4f14449b13c6314b066ad885a4596e23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Włodarska, Katarzyna</creatorcontrib><creatorcontrib>Pawlak-Lemańska, Katarzyna</creatorcontrib><creatorcontrib>Sikorska, Ewa</creatorcontrib><creatorcontrib>Institute of Quality Science, Poznań University of Economics and Business, Poland</creatorcontrib><collection>ECONIS</collection><collection>CrossRef</collection><jtitle>LogForum (Poznań, Poland)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Włodarska, Katarzyna</au><au>Pawlak-Lemańska, Katarzyna</au><au>Sikorska, Ewa</au><aucorp>Institute of Quality Science, Poznań University of Economics and Business, Poland</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>NIR technology for non-destructive monitoring of apple quality during storage</atitle><jtitle>LogForum (Poznań, Poland)</jtitle><date>2024-01-01</date><risdate>2024</risdate><volume>20</volume><issue>1</issue><spage>11</spage><epage>21</epage><pages>11-21</pages><issn>1895-2038</issn><eissn>1734-459X</eissn><doi>10.17270/J.LOG.000968</doi><tpages>11</tpages><oa>free_for_read</oa></addata></record>
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title NIR technology for non-destructive monitoring of apple quality during storage
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T16%3A05%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-econis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=NIR%20technology%20for%20non-destructive%20monitoring%20of%20apple%20quality%20during%20storage&rft.jtitle=LogForum%20(Poznan%CC%81,%20Poland)&rft.au=W%C5%82odarska,%20Katarzyna&rft.aucorp=Institute%20of%20Quality%20Science,%20Pozna%C5%84%20University%20of%20Economics%20and%20Business,%20Poland&rft.date=2024-01-01&rft.volume=20&rft.issue=1&rft.spage=11&rft.epage=21&rft.pages=11-21&rft.issn=1895-2038&rft.eissn=1734-459X&rft_id=info:doi/10.17270/J.LOG.000968&rft_dat=%3Ceconis_cross%3E1887162615%3C/econis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true