On Fractal Properties of Equipotentials over a Real Rough Surface Faced to Plasma in Fusion Devices
We consider a sheath region bounded by a corrugated surface of material conductor and a flat boundary held to a constant voltage bias. The real profile of the film deposited from plasma on a limiter in a fusion device was used in numerical solving of the Poisson's equation to find a profile of...
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Veröffentlicht in: | Plasma and Fusion Research 2008/01/10, Vol.3, pp.001-001 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | We consider a sheath region bounded by a corrugated surface of material conductor and a flat boundary held to a constant voltage bias. The real profile of the film deposited from plasma on a limiter in a fusion device was used in numerical solving of the Poisson's equation to find a profile of electrostatic potential. The rough surface influences the equipotential lines over the surface. We characterized a shape of equipotential lines by a fractal dimension. The long-range correlation in the potential field is imposed by the non-trivial fractal structure of the surface. Dust particles bounced in such irregular potential field can accelerate due to the Fermi acceleration. |
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ISSN: | 1880-6821 1880-6821 |
DOI: | 10.1585/pfr.3.001 |