On Fractal Properties of Equipotentials over a Real Rough Surface Faced to Plasma in Fusion Devices

We consider a sheath region bounded by a corrugated surface of material conductor and a flat boundary held to a constant voltage bias. The real profile of the film deposited from plasma on a limiter in a fusion device was used in numerical solving of the Poisson's equation to find a profile of...

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Veröffentlicht in:Plasma and Fusion Research 2008/01/10, Vol.3, pp.001-001
Hauptverfasser: BUDAEV, Viacheslav Petrovich, YAKOVLEV, Mikhail
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Sprache:eng
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Zusammenfassung:We consider a sheath region bounded by a corrugated surface of material conductor and a flat boundary held to a constant voltage bias. The real profile of the film deposited from plasma on a limiter in a fusion device was used in numerical solving of the Poisson's equation to find a profile of electrostatic potential. The rough surface influences the equipotential lines over the surface. We characterized a shape of equipotential lines by a fractal dimension. The long-range correlation in the potential field is imposed by the non-trivial fractal structure of the surface. Dust particles bounced in such irregular potential field can accelerate due to the Fermi acceleration.
ISSN:1880-6821
1880-6821
DOI:10.1585/pfr.3.001