Determination of Parallel and Perpendicular Ion Temperatures Based on Selective Ion Transmission in a Retarding Field Analyzer

This work reports a novel approach employing a retarding field analyzer (RFA) to simultaneously measure parallel and perpendicular ion temperatures. I-V curves obtained by the RFA were analyzed considering the influence of selective ion transmission, and the ion temperatures were evaluated. The RFA...

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Veröffentlicht in:Plasma and Fusion Research 2024/05/02, Vol.19, pp.1201021-1201021
Hauptverfasser: KAGAYA, Shigetaka, TAKAHASHI, Hiroyuki, SEINO, Tomohiro, YOSHIMURA, Keigo, NISHIMURA, Ryota, KANNO, Akihiro, TAKAHASHI, Yusaku, HARA, Tomoya, OISHI, Tetsutarou, MATSUYAMA, Akinobu, TOBITA, Kenji
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Sprache:eng
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Zusammenfassung:This work reports a novel approach employing a retarding field analyzer (RFA) to simultaneously measure parallel and perpendicular ion temperatures. I-V curves obtained by the RFA were analyzed considering the influence of selective ion transmission, and the ion temperatures were evaluated. The RFA analysis yielded parallel and perpendicular ion temperatures of 1.2 eV and 2.1 eV, respectively. The perpendicular ion temperature obtained by an ion sensitive probe was 2.0 eV, demonstrating good agreement with that evaluated by the RFA.
ISSN:1880-6821
1880-6821
DOI:10.1585/pfr.19.1201021