Phase stability of heteroepitaxial polydomain BaTiO 3 thin films
The phase stability of ferroelectric, epitaxial, polydomain BaTiO 3 thin films was examined using temperature-dependent x-ray diffraction (XRD) and in-plane electronic polarization measurements. The epitaxial BaTiO 3 thin films were grown on MgO(100) substrates by a metal-organic chemical vapor depo...
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Veröffentlicht in: | Journal of materials research 2007-05, Vol.22 (5), p.1384-1389 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The phase stability of ferroelectric, epitaxial, polydomain BaTiO
3
thin films was examined using temperature-dependent x-ray diffraction (XRD) and in-plane electronic polarization measurements. The epitaxial BaTiO
3
thin films were grown on MgO(100) substrates by a metal-organic chemical vapor deposition process. As-deposited and annealed BaTiO
3
thin films with different domain structures were examined. Temperature-dependent plane-normal XRD analysis reveals well-defined phase transitions at 140 and 169 °C in the
c
- and
a
-oriented films, respectively. The measured Curie temperatures are consistent with those predicted by Landau-Ginsburg-Devonshire theory as applied to polydomain BaTiO
3
thin films. Temperature-dependent in-plane electronic polarization measurements confirm that the 140 °C Curie temperature observed in the
c
-oriented film is a well-defined second-order paraelectric-ferroelectric transition. |
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ISSN: | 0884-2914 2044-5326 |
DOI: | 10.1557/jmr.2007.0178 |