SrTiO 3 films on platinized (0001) Al 2 O 3 : Characterization of texture and nonstoichiometry accommodation

Transmission electron microscopy and x-ray diffraction were used to study SrTiO 3 films grown on platinized (0001) Al 2 O 3 substrates. The Pt films were epitaxial with an orientation relationship described by (111) Pt ‖(0001) Al 2 O 3 and [110] Pt ‖[10 ¯ 1 0] Al 2 O 3 . SrTiO 3 films with two diffe...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Journal of materials research 2004-05, Vol.19 (5), p.1477-1486
Hauptverfasser:	Klenov, Dmitri O., Taylor, Troy R., Stemmer, Susanne
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!