Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy
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| Veröffentlicht in: | Methods in Microscopy 2025-01, Vol.1 (2), p.177-177 |
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| creator | Kievits, Arent J. Duinkerken, B. H. Peter Lane, Ryan de Heus, Cecilia van Beijeren Bergen en Henegouwen, Daan Höppener, Tibbe Wolters, Anouk H. G. Liv, Nalan Giepmans, Ben N. G. Hoogenboom, Jacob P. |
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| doi_str_mv | 10.1515/mim-2024-2001 |
| format | Article |
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| ispartof | Methods in Microscopy, 2025-01, Vol.1 (2), p.177-177 |
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| language | eng |
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| source | Walter De Gruyter: Open Access Journals |
| title | Corrigendum to: FAST-EM array tomography: a workflow for multibeam volume electron microscopy |
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