Scanning SQUID Microscopy Observation of Grain Boundary Junction in Tri-Phase Epitaxy NdBa2Cu3O7-δ Thin Film

Scanning SQUID Microscopy Observation of Grain Boundary Junction in Tri-Phase Epitaxy NdBa2Cu3O7-δ Thin Film

High quality grain boundary junction of NdBa2Cu3O7-δ (NBCO) thin films was fabricated by Tri-Phase Epitaxy technique. Current flows in the film with the junction and artificial defects were investigated by Scanning SQUID microscopy. Magnetic signals generated by the current in the sample were clearl...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Transactions of the Materials Research Society of Japan 2010/03/01, Vol.35(1), pp.195-196
Hauptverfasser: Arisawa, Shunichi, Yun, Kyungsung, Mochiduki, Kazuya, Iguchi, Ienari, Hatano, Takeshi, Wang, Huabing, Ishii, Akira
Format: Artikel
Sprache:eng
Schlagworte:
grain boundary
scanning probe microscopy
superconductor
thin film
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:High quality grain boundary junction of NdBa2Cu3O7-δ (NBCO) thin films was fabricated by Tri-Phase Epitaxy technique. Current flows in the film with the junction and artificial defects were investigated by Scanning SQUID microscopy. Magnetic signals generated by the current in the sample were clearly observed. Quantized magnetic vortices close to the grain boundary were also studied.
ISSN:1382-3469
2188-1650
DOI:10.14723/tmrsj.35.195