Approach to Highly Sensitive XAFS by Means of Bent Crystal Laue Analyzers

Approach to Highly Sensitive XAFS by Means of Bent Crystal Laue Analyzers

A log-spirally bent crystal Laue analyzer has been investigated and developed for highly sensitive in situ surface X-ray absorption fine structure (XAFS) measurement. Both calculations and experiments were conducted to obtain its intensity distributions on the different positions of the analyzer. A...

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Veröffentlicht in:Hyomen Kagaku 2017/08/10, Vol.38(8), pp.378-383
Hauptverfasser: WAKISAKA, Yuki, IWASAKI, Yuya, UEHARA, Hiromitsu, MUKAI, Shingo, KIDO, Daiki, TAKAKUSAGI, Satoru, UEMURA, Yohei, WADA, Takahiro, YUAN, Qiuyi, SEKIZAWA, Oki, URUGA, Tomoya, IWASAWA, Yasuhiro, ASAKURA, Kiyotaka
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bent crystal Laue analyzer
high-sensitive XAFS for ultra-dilute system
interface
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container_end_page 383
container_issue 8
container_start_page 378
container_title Hyomen Kagaku
container_volume 38
creator WAKISAKA, Yuki
IWASAKI, Yuya
UEHARA, Hiromitsu
MUKAI, Shingo
KIDO, Daiki
TAKAKUSAGI, Satoru
UEMURA, Yohei
WADA, Takahiro
YUAN, Qiuyi
SEKIZAWA, Oki
URUGA, Tomoya
IWASAWA, Yasuhiro
ASAKURA, Kiyotaka
description A log-spirally bent crystal Laue analyzer has been investigated and developed for highly sensitive in situ surface X-ray absorption fine structure (XAFS) measurement. Both calculations and experiments were conducted to obtain its intensity distributions on the different positions of the analyzer. A home-made log-spirally bent crystal Laue analyzer was made and evaluated. It was revealed that higher XAFS signals were obtained with the home-made analyzer than with the commercial one.
doi_str_mv 10.1380/jsssj.38.378
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subjects bent crystal Laue analyzer
high-sensitive XAFS for ultra-dilute system
interface
title Approach to Highly Sensitive XAFS by Means of Bent Crystal Laue Analyzers
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