Approach to Highly Sensitive XAFS by Means of Bent Crystal Laue Analyzers

A log-spirally bent crystal Laue analyzer has been investigated and developed for highly sensitive in situ surface X-ray absorption fine structure (XAFS) measurement. Both calculations and experiments were conducted to obtain its intensity distributions on the different positions of the analyzer. A...

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Veröffentlicht in:	Hyomen Kagaku 2017/08/10, Vol.38(8), pp.378-383
Hauptverfasser:	WAKISAKA, Yuki, IWASAKI, Yuya, UEHARA, Hiromitsu, MUKAI, Shingo, KIDO, Daiki, TAKAKUSAGI, Satoru, UEMURA, Yohei, WADA, Takahiro, YUAN, Qiuyi, SEKIZAWA, Oki, URUGA, Tomoya, IWASAWA, Yasuhiro, ASAKURA, Kiyotaka
Format:	Artikel
Sprache:	eng
Schlagworte:	bent crystal Laue analyzer high-sensitive XAFS for ultra-dilute system interface
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Beschreibung
Zusammenfassung:	A log-spirally bent crystal Laue analyzer has been investigated and developed for highly sensitive in situ surface X-ray absorption fine structure (XAFS) measurement. Both calculations and experiments were conducted to obtain its intensity distributions on the different positions of the analyzer. A home-made log-spirally bent crystal Laue analyzer was made and evaluated. It was revealed that higher XAFS signals were obtained with the home-made analyzer than with the commercial one.
ISSN:	0388-5321 1881-4743
DOI:	10.1380/jsssj.38.378