Dynamic response characteristics and linearization of a liquid crystal cladding waveguide beam scanner

The liquid crystal (LC) cladding waveguide beam scanner realizes beam scanning based on the modulation of the effective refractive index of the waveguide mode caused by the field-induced rotation of the LC molecules, which has the advantages of fast response speed, high stability, continuous scanning, simple structure, and low cost. Nonetheless, due to the distinct response mechanisms of LC molecules during the electric field on and off processes, the scanning process exhibits non-linear characteristics. Consequently, this paper delves into the dynamic response mechanism of beam deflection in the LC cladding waveguide beam scanner, formulates a physical model for this mechanism, and assesses the beam's response characteristics under varying voltage driving modes through both simulation and experimental tests. Ultimately, an optimal driving voltage waveform is designed to enable stable and consistent linear beam scanning. According to the coefficient R 2 of determination for linear characterization in the linear regression model, its scanning linearity can attain 0.994.