Direct measurement of 248- and 193-nm excimer-induced densification in silica–germania waveguide blanks: comment

Direct measurement of 248- and 193-nm excimer-induced densification in silica–germania waveguide blanks: comment

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Veröffentlicht in:Journal of the Optical Society of America. B, Optical physics Optical physics, 2002-09, Vol.19 (9), p.2039
Hauptverfasser: Poumellec, Bertrand, Niay, Pierre
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container_title Journal of the Optical Society of America. B, Optical physics
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title Direct measurement of 248- and 193-nm excimer-induced densification in silica–germania waveguide blanks: comment
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