Communication-Electrochemical Atomic Layer Etching of Copper
A novel process for the electrochemical atomic layer etching (e-ALE) of copper (Cu) is presented. In this process, Cu first undergoes surface-limited sulfidization to form a monolayer of copper sulfide (Cu2S). The Cu2S layer is then selectively etched in hydrochloric acid without etching the underly...
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Veröffentlicht in: | Journal of the Electrochemical Society 2018-01, Vol.165 (7), p.D282-D284 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | A novel process for the electrochemical atomic layer etching (e-ALE) of copper (Cu) is presented. In this process, Cu first undergoes surface-limited sulfidization to form a monolayer of copper sulfide (Cu2S). The Cu2S layer is then selectively etched in hydrochloric acid without etching the underlying Cu. The steps of surface-limited sulfidization of Cu and selective etching of the resulting Cu2S are repeated sequentially to achieve a net etch rate of close to one Cu monolayer etched per e-ALE cycle. Surface-limited etching is shown to minimize roughness amplification thereby preserving the near-atomic flatness of the original Cu electrode. |
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ISSN: | 0013-4651 1945-7111 |
DOI: | 10.1149/2.0901807jes |