Communication-A Phosphorus Pentafluoride Scavenger to Suppress Solid Electrolyte Interphase Damage at Moderately Elevated Temperature

We demonstrate that lithium/silicon monoxide (SiO) cell failure can be hindered by utilizing a Lewis-basic tris(2,2,2-trifluoroethyl) phosphite (TTFP), as an electrolyte additive. In the absence of TTFP, the solid electrolyte interphase (SEI) on the SiO electrode is attacked by Lewis-acidic phosphor...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of the Electrochemical Society 2017-01, Vol.164 (14), p.A3699-A3701
Hauptverfasser: Kim, Jongjung, Kim, Hyun-seung, Lee, Jae Gil, Jeong, Hyejeong, Ryu, Ji Heon, Oh, Seung M.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:We demonstrate that lithium/silicon monoxide (SiO) cell failure can be hindered by utilizing a Lewis-basic tris(2,2,2-trifluoroethyl) phosphite (TTFP), as an electrolyte additive. In the absence of TTFP, the solid electrolyte interphase (SEI) on the SiO electrode is attacked by Lewis-acidic phosphorus pentafluoride (PF5) generated by thermal decomposition of lithium hexafluorophosphate (LiPF6) at moderately elevated temperature. The SEI damage is followed by electrolyte decomposition/film deposition on the damaged electrode surface causing film growth, which leads to severe cell polarization and eventual failure. Conversely, effective PF5 scavenging by TTFP through Lewis acid-base adduct formation decreases SEI damage and thus hinders cell failure.
ISSN:0013-4651
1945-7111
DOI:10.1149/2.0691714jes