Grain Boundary Blocking Effect in Yttria Stabilized Zirconia Thin Films

The cross-plane oxygen ion conductivity of yttria stabilized zirconia thin films prepared by aerosol assisted chemical vapor deposition is strongly influenced by the thin film microstructure. Thin films with highly textured columnar grains oriented parallel to the current direction exhibit significantly higher conductivity than thin films with randomly oriented nanocrystalline microstructure, where ionic transport proceeds through the numerous grain boundaries. The total conductivity of columnar AA-CVD thin films is consistent with literature values on oxygen ion conduction through chemically pure YSZ grains as determined for microcrystalline samples, while that of the nanocrystalline specimens is similar to corresponding specific grain boundary conductivities.