Conductive AFM Measurements on Carbon Nanotubes and Application for CNTFET Characterization

Conductive AFM Measurements on Carbon Nanotubes and Application for CNTFET Characterization

In this work we report results of conductive atomic force microscopy (C-AFM) measurements performed on carbon nanotubes (CNTs) which are the inherent part of fully functional carbon nanotube field-effect transistors (CNTFET). The CNTs are grown in-situ, directly in their final position between sourc...

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Hauptverfasser: Rispal, Lorraine, Ruland, Tino, Stefanov, Yordan, Wessely, Frank, Schwalke, Udo
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Ruland, Tino
Stefanov, Yordan
Wessely, Frank
Schwalke, Udo
description In this work we report results of conductive atomic force microscopy (C-AFM) measurements performed on carbon nanotubes (CNTs) which are the inherent part of fully functional carbon nanotube field-effect transistors (CNTFET). The CNTs are grown in-situ, directly in their final position between source and drain, in order to avoid complicated postgrowth alignment techniques. Our goal is to characterize the CNTs after growth.
doi_str_mv 10.1149/1.2356303
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title Conductive AFM Measurements on Carbon Nanotubes and Application for CNTFET Characterization
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