Conductive AFM Measurements on Carbon Nanotubes and Application for CNTFET Characterization

In this work we report results of conductive atomic force microscopy (C-AFM) measurements performed on carbon nanotubes (CNTs) which are the inherent part of fully functional carbon nanotube field-effect transistors (CNTFET). The CNTs are grown in-situ, directly in their final position between source and drain, in order to avoid complicated postgrowth alignment techniques. Our goal is to characterize the CNTs after growth.