Substrate Trenching Mechanism during Plasma and Magnetically Enhanced Polysilicon Etching
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Veröffentlicht in: | Journal of the Electrochemical Society 1991-04, Vol.138 (4), p.1112-1117 |
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container_issue | 4 |
container_start_page | 1112 |
container_title | Journal of the Electrochemical Society |
container_volume | 138 |
creator | Van Nguyen, Son Dobuzinsky, Dave Stiffler, Scott R. Chrisman, Greg |
description | |
doi_str_mv | 10.1149/1.2085726 |
format | Article |
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identifier | ISSN: 0013-4651 |
ispartof | Journal of the Electrochemical Society, 1991-04, Vol.138 (4), p.1112-1117 |
issn | 0013-4651 1945-7111 |
language | eng |
recordid | cdi_crossref_primary_10_1149_1_2085726 |
source | IOP Publishing Journals |
title | Substrate Trenching Mechanism during Plasma and Magnetically Enhanced Polysilicon Etching |
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