Interface states distribution in electrical stressed oxynitrided gate-oxide

Interface states distribution in electrical stressed oxynitrided gate-oxide

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Veröffentlicht in:Journal of the Electrochemical Society 1998-07, Vol.145 (7), p.2489-2493
Hauptverfasser: BELKOUCH, S, NGUYEN, T. K, LANDSBERGER, L. M, AKTIK, C, JEAN, C, KAHRIZI, M
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Sprache:eng
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Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
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container_end_page 2493
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container_title Journal of the Electrochemical Society
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creator BELKOUCH, S
NGUYEN, T. K
LANDSBERGER, L. M
AKTIK, C
JEAN, C
KAHRIZI, M
description
doi_str_mv 10.1149/1.1838666
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ispartof Journal of the Electrochemical Society, 1998-07, Vol.145 (7), p.2489-2493
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1945-7111
language eng
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source IOP Publishing Journals
subjects Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
title Interface states distribution in electrical stressed oxynitrided gate-oxide
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