Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film
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Veröffentlicht in: | Journal of the Electrochemical Society 1996, Vol.143 (1), p.302-305 |
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container_title | Journal of the Electrochemical Society |
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creator | DANG, T. A CHAU, C. N |
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doi_str_mv | 10.1149/1.1836427 |
format | Article |
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ispartof | Journal of the Electrochemical Society, 1996, Vol.143 (1), p.302-305 |
issn | 0013-4651 1945-7111 |
language | eng |
recordid | cdi_crossref_primary_10_1149_1_1836427 |
source | IOP Publishing Journals |
subjects | Applied sciences Electrical engineering. Electrical power engineering Exact sciences and technology Miscellaneous Various equipment and components |
title | Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film |
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