Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of the Electrochemical Society 1996, Vol.143 (1), p.302-305
Hauptverfasser: DANG, T. A, CHAU, C. N
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 305
container_issue 1
container_start_page 302
container_title Journal of the Electrochemical Society
container_volume 143
creator DANG, T. A
CHAU, C. N
description
doi_str_mv 10.1149/1.1836427
format Article
fullrecord <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1149_1_1836427</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2975088</sourcerecordid><originalsourceid>FETCH-LOGICAL-c256t-17b21d514c366e8efe5ceed9a206df6714cbb278ebbc455d94aef68a3be31ecf3</originalsourceid><addsrcrecordid>eNo9UE1LxDAQDaLgunrwH-TgxUPXTpqvHmVZP2BhD-rVkqYTGuk2JSks---NungYZt6bNwPvEXIL5QqA1w-wAl1JztQZWUDNRaEA4JwsyhKqgksBl-Qqpa8MQXO1IJ-bAe0cw0jT9DskG6YjdSFS2-PeWzNQM5rhmHyiwVEbwkAPvZ-RTn1IuWLKpJmxowc_9_TN7xidez9S54f9NblwZkh4c-pL8vG0eV-_FNvd8-v6cVtYJuRcgGoZdAK4raREjQ6FRexqw0rZOanyom2Z0ti2lgvR1dygk9pULVaA1lVLcv_312YHKaJrpuj3Jh4bKJufYBpoTsFk7d2fdjIp23PRjNan_wNWK1FqXX0DA9lkGg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film</title><source>IOP Publishing Journals</source><creator>DANG, T. A ; CHAU, C. N</creator><creatorcontrib>DANG, T. A ; CHAU, C. N</creatorcontrib><identifier>ISSN: 0013-4651</identifier><identifier>EISSN: 1945-7111</identifier><identifier>DOI: 10.1149/1.1836427</identifier><identifier>CODEN: JESOAN</identifier><language>eng</language><publisher>Pennington, NJ: Electrochemical Society</publisher><subject>Applied sciences ; Electrical engineering. Electrical power engineering ; Exact sciences and technology ; Miscellaneous ; Various equipment and components</subject><ispartof>Journal of the Electrochemical Society, 1996, Vol.143 (1), p.302-305</ispartof><rights>1996 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c256t-17b21d514c366e8efe5ceed9a206df6714cbb278ebbc455d94aef68a3be31ecf3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,4012,27910,27911,27912</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=2975088$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>DANG, T. A</creatorcontrib><creatorcontrib>CHAU, C. N</creatorcontrib><title>Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film</title><title>Journal of the Electrochemical Society</title><subject>Applied sciences</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Exact sciences and technology</subject><subject>Miscellaneous</subject><subject>Various equipment and components</subject><issn>0013-4651</issn><issn>1945-7111</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNo9UE1LxDAQDaLgunrwH-TgxUPXTpqvHmVZP2BhD-rVkqYTGuk2JSks---NungYZt6bNwPvEXIL5QqA1w-wAl1JztQZWUDNRaEA4JwsyhKqgksBl-Qqpa8MQXO1IJ-bAe0cw0jT9DskG6YjdSFS2-PeWzNQM5rhmHyiwVEbwkAPvZ-RTn1IuWLKpJmxowc_9_TN7xidez9S54f9NblwZkh4c-pL8vG0eV-_FNvd8-v6cVtYJuRcgGoZdAK4raREjQ6FRexqw0rZOanyom2Z0ti2lgvR1dygk9pULVaA1lVLcv_312YHKaJrpuj3Jh4bKJufYBpoTsFk7d2fdjIp23PRjNan_wNWK1FqXX0DA9lkGg</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>DANG, T. A</creator><creator>CHAU, C. N</creator><general>Electrochemical Society</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>1996</creationdate><title>Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film</title><author>DANG, T. A ; CHAU, C. N</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c256t-17b21d514c366e8efe5ceed9a206df6714cbb278ebbc455d94aef68a3be31ecf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Applied sciences</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Exact sciences and technology</topic><topic>Miscellaneous</topic><topic>Various equipment and components</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>DANG, T. A</creatorcontrib><creatorcontrib>CHAU, C. N</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Journal of the Electrochemical Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>DANG, T. A</au><au>CHAU, C. N</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film</atitle><jtitle>Journal of the Electrochemical Society</jtitle><date>1996</date><risdate>1996</risdate><volume>143</volume><issue>1</issue><spage>302</spage><epage>305</epage><pages>302-305</pages><issn>0013-4651</issn><eissn>1945-7111</eissn><coden>JESOAN</coden><cop>Pennington, NJ</cop><pub>Electrochemical Society</pub><doi>10.1149/1.1836427</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0013-4651
ispartof Journal of the Electrochemical Society, 1996, Vol.143 (1), p.302-305
issn 0013-4651
1945-7111
language eng
recordid cdi_crossref_primary_10_1149_1_1836427
source IOP Publishing Journals
subjects Applied sciences
Electrical engineering. Electrical power engineering
Exact sciences and technology
Miscellaneous
Various equipment and components
title Electron spectroscopy for chemical analysis of cool white phosphors coated with SiO2 thin film
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T05%3A12%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electron%20spectroscopy%20for%20chemical%20analysis%20of%20cool%20white%20phosphors%20coated%20with%20SiO2%20thin%20film&rft.jtitle=Journal%20of%20the%20Electrochemical%20Society&rft.au=DANG,%20T.%20A&rft.date=1996&rft.volume=143&rft.issue=1&rft.spage=302&rft.epage=305&rft.pages=302-305&rft.issn=0013-4651&rft.eissn=1945-7111&rft.coden=JESOAN&rft_id=info:doi/10.1149/1.1836427&rft_dat=%3Cpascalfrancis_cross%3E2975088%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true