Tensile Strain in Si Due to Expansion of Lattice Spacings in CeO[sub 2] Epitaxially Grown on Si(111)
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Veröffentlicht in: | Journal of the Electrochemical Society 2004, Vol.151 (9), p.F202 |
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container_issue | 9 |
container_start_page | F202 |
container_title | Journal of the Electrochemical Society |
container_volume | 151 |
creator | Nishikawa, Yukie Matsushita, Daisuke Satou, Nobutaka Yoshiki, Masahiko Schimizu, Tatsuo Yamaguchi, Takeshi Satake, Hideki Fukushima, Noburu |
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doi_str_mv | 10.1149/1.1782120 |
format | Article |
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ispartof | Journal of the Electrochemical Society, 2004, Vol.151 (9), p.F202 |
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language | eng ; jpn |
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source | IOP Publishing Journals |
title | Tensile Strain in Si Due to Expansion of Lattice Spacings in CeO[sub 2] Epitaxially Grown on Si(111) |
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