Environmental-Friendly Fluorine Mixture for CVD Cleaning Processes to Replace C 2 F 6 , CF 4 and NF 3

The target of this work was to find viable alternative CVD-cleaning gas mixtures for the semiconductor industry, which are environmental-friendly and in addition can be used as a “drop in” to avoid high investment costs from equipment modification. Our study has demonstrated that this can be achieve...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:ECS transactions 2016-07, Vol.72 (19), p.23-34
Hauptverfasser: Wieland, Robert, Pittroff, Michael, Boudaden, Jamila, Altmannshofer, Stephan, Kutter, Christoph
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The target of this work was to find viable alternative CVD-cleaning gas mixtures for the semiconductor industry, which are environmental-friendly and in addition can be used as a “drop in” to avoid high investment costs from equipment modification. Our study has demonstrated that this can be achieved with F 2 -based gas mixtures, which also provide a more efficient and faster cleaning behavior for most applications. A cleaning efficiency gain of a factor 1.3 up to 17 can be expected, relative to the F 2 -amount required for cleaning. This gain in efficiency depends on the cleaning gas to be replaced and on the reactor type. A shorter cleaning time can lead into a higher equipment throughput and more cost effective usage of thin film tools. To generate data on particle and tool attrition, a first “mini marathon” test run has been performed. The test reactor, a 200mm wafer size CVD tool, was equipped with a mass spectrometer to monitor the end point of the chamber cleaning and to gain an overview of the waste gases going into the abatement system
ISSN:1938-5862
1938-6737
DOI:10.1149/07219.0023ecst