Resistance Switching Properties of Titanium Oxide with Different Copper Electrode Structure

The reversible resistance switching (RS) effect of the Al/TiO x /Cu structure was investigated in this study. This RS is attributed to space-charge-limited conduction controlled by localized copper ions trap near the Cu electrode. Filament formation and dissolution in the Al/TiO x /Cu system were discussed to compare with the Cu/TiO x /Al decice. The linear relationship between the reset current and compliance current was discussed, it shown that the method to measurement play a important role. The electrical transport mechanism during the resistance switch periods are controlled by space charge limited current (SCLC) theory.