Improving Mobility of F-Doped SnO 2 Thin Films by Introducing Temperature Gradient during Low-Pressure Chemical Vapor Deposition

High mobility is required to suppress free-carrier absorption in the near-infrared (NIR) region. Toward this end, we investigated the properties of a F-doped SnO 2 (FTO) film deposited using low-pressure chemical vapor deposition (LPCVD) and found that the optimum deposition temperature varied with...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Japanese Journal of Applied Physics 2012-09, Vol.51 (9R), p.95801
Hauptverfasser: Isshiki, Masanobu, Ikeda, Toru, Okubo, Junichi, Oyama, Takuji, Shidoji, Eiji, Odaka, Hidefumi, Sichanugrist, Porponth, Konagai, Makoto
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:High mobility is required to suppress free-carrier absorption in the near-infrared (NIR) region. Toward this end, we investigated the properties of a F-doped SnO 2 (FTO) film deposited using low-pressure chemical vapor deposition (LPCVD) and found that the optimum deposition temperature varied with film thickness. On the basis of this result, we introduced a temperature gradient into LPCVD, which resulted in an improvement in the mobility of F-doped SnO 2 on glass to 77.5 cm 2 V -1 s -1 .
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.51.095801