Preparation and Characterization of Silicon Nanoparticles for Solution-Processed Thin Film

We describe the synthesis of the alkoxy-capped silicon nanoparticles (Si NPs) via solution route without an explicit reduction process. Based on the UV--visible absorption and photoluminescence (PL) emission spectra of the alkoxy-capped Si NPs, the average size of Si NPs is estimated to be ca. 3 nm. Fourier transform infrared (FT-IR) spectroscopy on the sintered Si thin film confirms elimination of the alkyl groups from the nanoparticles as evidenced by the shrinkage of the absorption peaks corresponding to --CH n and Si--OR. Although the silicon film was highly resistive, we have consistently observed the electrical conduction from films coated with the doped NPs.