AlGaN/GaN/AlGaN Double Heterostructures on Silicon Substrates for High Breakdown Voltage Field-Effect Transistors with low On-Resistance
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Veröffentlicht in: | Japanese Journal of Applied Physics 2009-04, Vol.48 (4S), p.4 |
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container_issue | 4S |
container_start_page | 4 |
container_title | Japanese Journal of Applied Physics |
container_volume | 48 |
creator | Visalli, Domenica Hove, Marleen Van Derluyn, Joff Degroote, Stefan Leys, Maarten Cheng, Kai Germain, Marianne Borghs, Gustaaf |
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doi_str_mv | 10.1143/JJAP.48.04C101 |
format | Article |
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ispartof | Japanese Journal of Applied Physics, 2009-04, Vol.48 (4S), p.4 |
issn | 0021-4922 1347-4065 |
language | eng |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
title | AlGaN/GaN/AlGaN Double Heterostructures on Silicon Substrates for High Breakdown Voltage Field-Effect Transistors with low On-Resistance |
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