Accurate Extraction of Excess Channel Thermal Noise Coefficient in Berkeley Short-Channel Insulated Gate Field-Effect Transistor Model 4

Accurate Extraction of Excess Channel Thermal Noise Coefficient in Berkeley Short-Channel Insulated Gate Field-Effect Transistor Model 4

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Veröffentlicht in:Japanese Journal of Applied Physics 2009-04, Vol.48 (4S), p.4
Hauptverfasser: Jeon, Jongwook, Lee, Jaehong, Park, Chan Hyeong, Lee, Hyunwoo, Oh, Hansu, Kang, Ho-Kyu, Park, Byung-Gook, Shin, Hyungcheol
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container_issue 4S
container_start_page 4
container_title Japanese Journal of Applied Physics
container_volume 48
creator Jeon, Jongwook
Lee, Jaehong
Park, Chan Hyeong
Lee, Hyunwoo
Oh, Hansu
Kang, Ho-Kyu
Park, Byung-Gook
Shin, Hyungcheol
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doi_str_mv 10.1143/JJAP.48.04C037
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title Accurate Extraction of Excess Channel Thermal Noise Coefficient in Berkeley Short-Channel Insulated Gate Field-Effect Transistor Model 4
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