Stress on Junction-Down-Mounted Ridge-Waveguide Laser Diodes
A novel way of evaluating thermal stress on junction-down-mounted ridge-waveguide laser diodes is proposed and demonstrated. Namely, spatially resolved electroluminescence and photoluminescence observations revealed that a localized stress of 2.2×10 7 Pa led to gradual degradation during aging.
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| Veröffentlicht in: | Japanese Journal of Applied Physics 2005-04, Vol.44 (4R), p.1756 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | A novel way of evaluating thermal stress on junction-down-mounted ridge-waveguide laser diodes is proposed and demonstrated. Namely, spatially resolved electroluminescence and photoluminescence observations revealed that a localized stress of 2.2×10
7
Pa led to gradual degradation during aging. |
|---|---|
| ISSN: | 0021-4922 1347-4065 |
| DOI: | 10.1143/JJAP.44.1756 |