Generalized Interconnect Delay Time and Crosstalk Models: II. Crosstalk-Induced Delay Time Deterioration and Worst Crosstalk Models

New analytical models for estimating crosstalk-induced delay time deterioration and the worst crosstalk models of a coupled interconnect for ramp input waveform are derived. The accuracy of these compact models at various driver resistances, loading capacitances, and input-ramping rates is verified...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Japanese Journal of Applied Physics 2001-12, Vol.40 (12R), p.6694
Hauptverfasser: Lee, Trent Gwo-Yann, Tseng, Tseung-Yuen, Wong, Shyh-Chyi, Yang, Cheng-Jer, Liang, Mong Song, Cheng, Huang-Chung
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:New analytical models for estimating crosstalk-induced delay time deterioration and the worst crosstalk models of a coupled interconnect for ramp input waveform are derived. The accuracy of these compact models at various driver resistances, loading capacitances, and input-ramping rates is verified by simulation program with integrated circuit emphasis (SPICE) simulation for the parallel interconnect system. The effects of crosstalk noise on the delay time at various ramp input rise times, for both simultaneous and non-simultaneous switching cases, are discussed here. In this study we show that crosstalk noise will be a limiting factor for future fast transition signals. The results reported herein are useful in the studies of delay time uncertainties due to noise and the interconnect worst-case design.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.40.6694