Structural Analysis of 6H–SiC(0001)√3×√3 Reconstructed Surface

Using coaxial impact-collision ion scattering spectroscopy (CAICISS), the structure of the 6H–SiC(0001)√3×√3 reconstructed surface was investigated. As a result of composition analysis, the topmost layer of this surface was found to be covered with Si adatoms. Moreover, from the incidence angle depe...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Japanese Journal of Applied Physics 2000-11, Vol.39 (11R), p.6410
Hauptverfasser: Fujino, Toshiaki, Fuse, Takashi, Ryu, Jeong-Tak, Inudzuka, Katsuhiko, Yamazaki, Yujin, Katayama, Mitsuhiro, Oura, Kenjiro
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Using coaxial impact-collision ion scattering spectroscopy (CAICISS), the structure of the 6H–SiC(0001)√3×√3 reconstructed surface was investigated. As a result of composition analysis, the topmost layer of this surface was found to be covered with Si adatoms. Moreover, from the incidence angle dependence of the scattering intensity due to C atoms, it was found that the √3×√3 periodicity was formed by a one-third monolayer of Si adatoms occupying T 4 sites, and the height of the Si adatoms from the first substrate layer was determined to be 1.5±0.2 Å.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.39.6410