Structural Analysis of 6H–SiC(0001)√3×√3 Reconstructed Surface
Using coaxial impact-collision ion scattering spectroscopy (CAICISS), the structure of the 6H–SiC(0001)√3×√3 reconstructed surface was investigated. As a result of composition analysis, the topmost layer of this surface was found to be covered with Si adatoms. Moreover, from the incidence angle depe...
Gespeichert in:
Veröffentlicht in: | Japanese Journal of Applied Physics 2000-11, Vol.39 (11R), p.6410 |
---|---|
Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Using coaxial impact-collision ion scattering spectroscopy (CAICISS), the structure of the 6H–SiC(0001)√3×√3 reconstructed surface was investigated. As a result of composition analysis, the topmost layer of this surface was found to be covered with Si adatoms. Moreover, from the incidence angle dependence of the scattering intensity due to C atoms, it was found that the √3×√3 periodicity was formed by a one-third monolayer of Si adatoms occupying T
4
sites, and the height of the Si adatoms from the first substrate layer was determined to be 1.5±0.2 Å. |
---|---|
ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.39.6410 |